The WaferCheck 150 system is a complete and easy to use system for Time-Resolved Photoluminescence (TRPL) measurements.
The WaferCheck 150 system is a complete and easy to use system for
Time-Resolved Photoluminescence (TRPL) measurements. TRPL is a very powerful tool for the contact-free characterization and investigation of semiconductor materials. It is non-destructive and involves only light as a probe. It can be used for everything from raw materials to in-process intermediates to finished devices. These capabilities qualify TRPL as a valuable analysis tool for research, testing and quality control.
